10.1016/j.physa.2012.11.020

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Characterization of nanostructured material images using fractal descriptors

Joao B. Florindo and Mariana S. Sikora and Ernesto C. Pereira and Odemir M. Bruno

PHYSICA A-STATISTICAL MECHANICS AND ITS APPLICATIONS, 392(7):1694-1701, 2013

This work presents a methodology to the morphology analysis and characterization of nanostructured material images acquired from FEG-SEM (Field Emission Gun-Scanning Electron Microscopy) technique. The metrics were extracted from the image texture (mathematical surface) by the volumetric fractal descriptors, a methodology based on the Bouligand-Minkowski fractal dimension, which considers the properties of the Minkowski dilation of the surface points. An experiment with galvanostatic anodic titanium oxide samples prepared in oxalyc acid solution using different conditions of applied current, oxalyc acid concentration and solution temperature was performed. The results demonstrate that the approach is capable of characterizing complex morphology characteristics such as those present in the anodic titanium oxide. (C) 2012 Elsevier B.V. All rights reserved.